NANO-MASTER
USPTO Trademark Record · Serial No. 74290937
Trademark details
It was initially claimed by NANO-MASTER, INC. on 19920706.
That brand applies to the following goods and services:overlay measurement, critical dimension measurement, and registration measurement tools; and defect inspection models and tools for use in the semiconductor manufacturing industry.
You can learn more about that trademark on the USPTO website: View the USPTO record
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