MICROSCAN
USPTO Trademark Record · Serial No. 73817101
Trademark details
It was initially claimed by KLA-TENCOR CORPORATION on 19890804.
That brand applies to the following goods and services:COMPUTER BASED STATION FOR THE AUTOMATIC CHARACTERIZATION OF SEMICONDUCTOR WAFERS AS TO THICKNESS, GLOBAL AND SITE FLATNESS, BOW, WARP, CONDUCTIVITY TYPE, RESISTIVITY AND OTHER PARAMETERS.
Currently that trademark is represented by trademark attorney(s): CHARLES L. GAGNEBIN III.
You can learn more about that trademark on the USPTO website: View the USPTO record
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