XDVM
USPTO Trademark Record · Serial No. 75558644
Trademark details
It was initially claimed by HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK on 19980925.
That brand applies to the following goods and services:Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments], instruments for measuring thickness of coatings, alloy compositions, material analysis, [porosity, electrical conductivity,] ferrite content, [ micro-hardness,] and other properties of coatings and layers;[ magneto,-opto, -and electronic data recording media,, training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; providing on-line training via a global computer network in the use and operation of scientific, electrical monitoring and measuring instruments and computers and software used therein, product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of software used therein; computer services, namely, designing and implementing web sites for others.
Currently that trademark is represented by trademark attorney(s): Edward M. Kriegsman.
You can learn more about that trademark on the USPTO website: View the USPTO record
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