PAS
USPTO Trademark Record · Serial No. 74139934
Trademark details
It was initially claimed by THERMA-WAVE, INC. on 19910219.
That brand applies to the following goods and services:computer program for use with a device for measuring parameters of semiconductor wafers, including metal thickness and deposit monitoring, noncontact resistivity monitoring, grain structure monitoring, dielectric film thickness and RIE/plasma etch damage minimization.
Currently that trademark is represented by trademark attorney(s): Michael A. Stallman.
You can learn more about that trademark on the USPTO website: View the USPTO record
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