FEI
USPTO Trademark Record · Serial No. 74123931
Trademark details
It was initially claimed by FEI Company on 19901217.
That brand applies to the following goods and services:high brightness, submicron focused ion and electron beam systems using field emission technology; namely, for ion beam micromachining, ion milling, ion lithography, ion microscopes, secondary ion mass spectroscopy, electron microscopes and combined ion beam milling/electron microscope systems; high brightness, submicron ion and electron beam columns using field emission technology; namely, ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, electron beam lith.
Currently that trademark is represented by trademark attorney(s): JERE M. WEBB.
You can learn more about that trademark on the USPTO website: View the USPTO record
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